Surface and Thin Film Analysis
A Compendium of Principles, Instrumentation, and Applications
(Sprache: Englisch)
Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.
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Produktinformationen zu „Surface and Thin Film Analysis “
Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.
Klappentext zu „Surface and Thin Film Analysis “
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.From a Review of the First Edition (edited by Bubert and Jenett)"... a useful resource..."(Journal of the American Chemical Society)
Inhaltsverzeichnis zu „Surface and Thin Film Analysis “
PrefaceINTRODUCTIONPART I: Electron DetectionX-RAY PHOTOELECTRON SPECTROSCOPY (XPS)PrinciplesInstrumentationSpectral Information and Chemical ShiftsQuantification, Depth Profiling, and ImagingThe Auger ParameterApplicationsUltraviolet Photoelectron Spectroscopy (UPS)AUGER ELECTRON SPECTROSCOPY (AES)PrinciplesInstrumentationSpectral InformationQuantification and Depth ProfilingApplicationsScanning Auger Microscopy (SAM)ELECTRON ENERGY-LOSS SPECTROSCOPY (EELS) AND ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPY (EFTEM)PrinciplesInstrumentationQualitative Spectral InformationQuantificationImaging of Element DistributionSummaryLOW-ENERGY ELECTRON DIFFRACTION (LEED)Principles and HistoryQualitative InformationQuantitative Structural InformationLow-Energy Electron MicroscopyOTHER ELECTRON-DETECTING TECHNIQUESIon (Excited) Auger Electron Spectroscopy (IAES)Ion Neutralization Spectroscopy (INS)Inelastic Electron Tunneling Spectroscopy (IETS)PART II: Ion DetectionSTATIC SECONDARY ION MASS SPECTROMETRY (SSIMS)PrinciplesInstrumentationQuantificationSpectral InformationApplicationsDYNAMIC SECONDARY ION MASS SPECTROMETRY (SIMS)PrinciplesInstrumentationSpectral InformationQuantificationMass SpectraDepth ProfilesImagingThree-Dimensional (3-D)-SIMSApplicationsELECTRON-IMPACT (EI) SECONDARY NEUTRAL MASS SPECTROMETRY (SNMS)IntroductionGeneral Principles of SNMSInstrumentation and MethodsSpectral Information and QuantificationElement Depth ProfilingApplicationsLASER SECONDARY NEUTRAL MASS SPECTROMETRY (LASER-SNMS)PrinciplesInstrumentationSpectral InformationQuantificationApplicationsRUTHERFORD BACKSCATTERING SPECTROSCOPY (RBS)IntroductionPrinciplesInstrumentationSpectral InformationQuantificationFigures of MeritApplicationsRelated TechniquesLOW-ENERGY ION SCATTERING (LEIS)PrinciplesInstrumentationLEIS InformationQuantificationApplications of LEISELASTIC RECOIL DETECTION ANALYSIS (ERDA)IntroductionFundamentalsParticle Identification MethodsEquipmentData AnalysisSensitivity and Depth
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ResolutionApplicationsNUCLEAR REACTION ANALYSIS (NRA)IntroductionPrinciplesEquipment and Depth ResolutionApplicationsFIELD ION MICROSCOPY (FIM) AND ATOM PROBE (AP)IntroductionPrinciples and InstrumentationApplicationsOTHER ION-DETECTING TECHNIQUESDesorption MethodsGlow-Discharge Mass Spectroscopy (GD-MS)Fast-Atom Bombardment Mass Spectroscopy (FABMS)PART III: Photon DetectionTOTAL-REFLECTION X-RAY DLUORESCENCE (TXRF) ANALYSISPrinciplesInstrumentationSpectral InformationQuantificationApplicationsENERGY-DISPERSIVE X-RAY SPECTROSCOPY (EDXS)PrinciplesPractical Aspects of X-Ray Microanalysis and InstrumentationQualitative Spectral InformationQuantificationImaging and Element DistributionSummaryGRAZING INCIDENCE X-RAY METHODS FOR NEAR-SURFACE STRUCTURAL STUDIESPrinciplesExperimental Techniques and Data AnalysisApplicationsGLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY (GD-OES)PrinciplesInstrumentationSpectral InformationQuantificationDepth ProfilingApplicationsSURFACE ANALYSIS BY LASER ABLATIONIntroductionInstrumentationDepth ProfilingNear-Field AblationConclusionION BEAM SPECTROCHEMICAL ANALYSIS (IBSCA)PrinciplesInstrumentationSpectral and Analytical InformationQuantitative Analysis by IBSCAApplicationsREFLECTION ABSORPTION IR SPECTROSCOPY (RAIRS)InstrumentationPrinciplesApplicationsRelated TechniquesSURFACE RAMAN SPECTROSCOPYPrinciplesSurface-Enhanced Raman Scattering (SERS)InstrumentationSpectral InformationQuantificationApplicationsNonlinear Optical Spectroscopy UV-VIS-IR ELLIPSOMETRY (ELL)PrinciplesInstrumentationApplicationsSUM FREQUENCY GENERATION (SFG) SPECTROSCOPYIntroduction to SFG SpectroscopySFG TheorySFG Instrumentation and Operation ModesApplications of SFG Spectroscopy and Selected Case StudiesConclusionOTHER PHOTON-DETECTING TECHNIQUESAppearance Potential MethodsInverse Photoemission Spectroscopy (IPES) and BremsstrahlungPART IV: Scanning Probe MicroscopyINTRODUCTIONATOMIC FORCE MICROSCOPY (AFM)PrinciplesFurther Modes of AFM OperationsInstrumentationApplicationsSCANNING TUNNELING MICROSCOPY (STM)PrinciplesInstrumentationLateral and Spectroscopy InformationApplicationsSCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM)IntroductionInstrumentation and OperationSNOM ApplicationsOutlookAPPENDIXSummary and Comparison of TechniquesSurface and Thin-Film Analytical Equipment Suppliers
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Autoren-Porträt
Gernot Friedbacher is Associate Professor of Analytical Chemistry at the Vienna University of Technology. His research activities are focused on investigation of surfaces and surface processes with scanning probe microscopy and electron probe x-ray microanalysis covering a broad field of applications ranging from basic research on thin film systems to materials science. Over the last decades he has held numerous theoretical and practical courses in the field of analytical chemistry with emphasis on intstrumental analysis and surface- and interface analysis. Prof. Friedbacher has published over 120 research articles, reviews, and book chapters.Henning Bubert worked at the Institut für Analytische Wissenschaften - ISAS - (Institute for Analytical Sciences) in Dortmund until his retirement in 2003. He is currently working as guest scientist. His research activities are mainly focused on investigation of surfaces and thin films by electron spectroscopy related to the development and application of new materials in mechanical engineering. He has published over 110 research articles, reviews, and book chapters.
Bibliographische Angaben
- 2011, 2. Aufl., XXIV, 534 Seiten, 11 farbige Abbildungen, 267 Schwarz-Weiss-Abbildungen, Masse: 18,2 x 24,7 cm, Gebunden, Englisch
- Herausgegeben: Gernot Friedbacher, Henning Bubert
- Verlag: Wiley-VCH
- ISBN-10: 3527320474
- ISBN-13: 9783527320479
- Erscheinungsdatum: 02.05.2011
Sprache:
Englisch
Rezension zu „Surface and Thin Film Analysis “
"This book is a handy reference work and contains much useful information for laboratories specializing in one or a few of the techniques; it enables them to compare their methodology with the many other techniques for surface and thin-film analysis." ( Anal Bioanal Chem , 2011) "...a useful resource..." Journal of the American Chemical Society
Pressezitat
"...a useful resource..." Journal of the American Chemical Society
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