VLSI Design and Test for Systems Dependability

Challenges and Opportunities in VLSI for Systems Dependability.- Design and Development of Electronic Systems for Quality and Dependability.- Radiation-Induced Soft Errors.- Electromagnetic Noises.- Variations in Device Characteristics.- Time-Dependent Degradation in Device Characteristics.- Connectivity in Wireless Telecommunications.- Connectivity in Electronic Packaging.- Responsiveness for Hard Real Time Control.- The Role of Security LSI and the Example of Malicious Attacks.- Verification and Test Coverage.- Unknown Threats and Provisions.- Design Automation for Reliability.- Formal Verification and Debugging of VLSI Logic Design for Systems Dependability:Experiments and Evaluation.- Virtualization: System-Level Fault Simulation of SRAM Errors in Automotive Electronic Control Systems.- DART - A Concept of In-Field Testing for Enhancing System De-pendability.- Design of SRAM Resilient against Dynamic Voltage Variations.- Design and Applications of Dependable Non-Volatile Memory Systems.- Network-on-Chip Based Multiple-Core Centrized ECUs for Safety-Critical Automotive Applications.- An On-Chip Router Architecture for Dependable Multicore Processor.- Wireless Interconnect in Electronic Systems.- Wireless Power Delivery Resilient against Loading Variations.- Extended Dependable Air: Use of Satellites in Boosting Dependability of PublicWireless Communications.- Responsive Multithreaded Processor for Hard Real-Time Robotic Applications.- A Low-Latency DMR Architecture with Fast Checkpoint Recovery Scheme Using Simultaneously Copyable SRAM.- A 3D-VLSI Architecture for Future Automotive Visual Recognition.- Applications of Reconfigurable Processors as Embedded Automatons in the IoT Sensor Networks in Space.- An FPGA Implementation of Comprehensive Security Functions for Systems-Level Authentication.- SRAM-Based Physically Unclonable Functions (PUFs) to Generate Signature out of Silicon for Authentication and Encryption.