Ihre Suche nach „Ray Long“ in „Technik“
Process-Induced Phase Separation in Polymer Blends
Suprakas Sinha Ray, Amanuel Geberekrstos, Tanyaradzwa Sympathy Muzata, Jonathan Tersur Orasugh
Fr. 219.90
Fr. 236.00
Fr. 71.00
The Railway Track and Its Long Term Behaviour
Konstantinos Tzanakakis
Fr. 177.00
Fr. 177.00
Fr. 177.00
X-Ray Scattering from Soft-Matter Thin Films
Metin Tolan
Fr. 118.00
Degradation Theory of Long Term Operated Materials and Structures
Grzegorz Lesiuk, José A.F.O. Correia, Halyna V. Krechkovska, Grzegorz Pekalski, Abílio M.P. de Jesus, Oleksandra Student
Fr. 153.50
Fr. 354.00
Long-Term Health State Estimation of Energy Storage Lithium-Ion Battery Packs
Qi Huang, Shunli Wang, Zonghai Chen, Ran Xiong, Carlos Fernandez, Daniel-I. Stroe
Fr. 177.00
Contact and Long-Term Behavior of Current-Carrying Connections in Electrical Power Engineering
Stephan Schlegel, Michael Gatzsche, Christian Hildmann, Toni Israel
Fr. 189.00
Fr. 236.00
Fr. 77.00
Fr. 77.00
X-Ray Multiple-Wave Diffraction
Shih-Lin Chang
Fr. 177.00
X-Ray Scattering of Soft Matter
Norbert Stribeck
Fr. 143.90
Computer Vision for X-Ray Testing
Domingo Mery
Fr. 68.00
Fr. 118.00
Navigation in Space by X-ray Pulsars
Amir Abbas Emadzadeh, Jason Lee Speyer
Fr. 118.00
Fr. 189.00
Theoretical Concepts of X-Ray Nanoscale Analysis
Andrei Benediktovitch, Ilya Feranchuk, Alexander Ulyanenkov
Fr. 165.50
Computer Simulation Tools for X-ray Analysis
Sérgio Luiz Morelhão
Fr. 79.90
Theoretical Concepts of X-Ray Nanoscale Analysis
Andrei Benediktovitch, Ilya Feranchuk, Alexander Ulyanenkov
Fr. 165.50
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
Fr. 118.00
Fr. 189.00
Photon Counting Detectors for X-ray Imaging
Hiroaki Hayashi, Natsumi Kimoto, Takashi Asahara, Takumi Asakawa, Cheonghae Lee, Akitoshi Katsumata
Fr. 118.00