Ihre Suche nach „Test Bankia“ in „Elekronik, Elektrotechnik & Nachrichtentechnik“
Non-parametric Tuning of PID Controllers
Igor Boiko
Fr. 118.00
Micro-Electrode-Dot-Array Digital Microfluidic Biochips
Zipeng Li, Krishnendu Chakrabarty, Tsung-Yi Ho, Chen-Yi Lee
Fr. 118.00
Fr. 177.00
Industrial Process Identification and Control Design
Tao Liu, Furong Gao
Fr. 177.00
Adaptive and Robust Active Vibration Control
Ioan Doré Landau, Tudor-Bogdan Airimioaie, Abraham Castellanos-Silva
Fr. 118.00
System-Level Validation
Mingsong Chen, Xiaoke Qin, Prabhat Mishra
Fr. 118.00
Leistungselektronik
Rainer Felderhoff, Udo Busch
Fr. 36.90
Hybrid Systems, Optimal Control and Hybrid Vehicles
Thomas J. Böhme, Benjamin Frank
Fr. 235.90
Robust Control Design for Active Driver Assistance Systems
Peter Gaspar, Zoltan Szabo, Jozsef Bokor
Fr. 195.90
Automated Validation & Verification of UML/OCL Models Using Satisfiability Solvers
Nils Przigoda, Robert Wille, Judith Przigoda, Rolf Drechsler
Fr. 177.00
Automatisieren mit SIMATIC S7-1200
Hans Berger
Fr. 79.90
Automatisieren mit SIMATIC S7-300 im TIA Portal
Hans Berger
Fr. 94.90
Fr. 118.00
Robust and Distributed Hypothesis Testing
Gökhan Gül
Fr. 118.00
Using WAVES and VHDL for Effective Design and Testing
James P. Hanna, Robert G. Hillman, Herb L. Hirsch, Tim H. Noh, Ranga R. Vemuri
Fr. 177.00
Design and Testing of Digital Microfluidic Biochips
Yang Zhao, Krishnendu Chakrabarty
Fr. 118.00
Contactless VLSI Measurement and Testing Techniques
Selahattin Sayil
Fr. 118.00
Delay Fault Testing for VLSI Circuits
Angela Krstic, Kwang-Ting Cheng
Fr. 177.00
Fr. 26.65
New Technologies in Electromagnetic Non-destructive Testing
Songling Huang, Shen Wang
Fr. 118.00
A Unified Approach for Timing Verification and Delay Fault Testing
Mukund Sivaraman, Andrzej J. Strojwas
Fr. 130.90
Development and Testing of Navigation Algorithms for Autonomous Underwater Vehicles
Francesco Fanelli
Fr. 118.00
Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements
Yuming Zhuang, Degang Chen
Fr. 118.00
Testing of Interposer-Based 2.5D Integrated Circuits
Ran Wang, Krishnendu Chakrabarty
Fr. 118.00
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
M. Bushnell, Vishwani Agrawal
Fr. 153.50
Fr. 208.90