Applied Scanning Probe Methods V.Vol.5
The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the...
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The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
- Yasuhisa Ando: Electrostatic Microscanner
- Tilman E. Schäffer: Low-NoiseMethods for Optical Measurements of Cantilever Deflections
- Hendrik Hšolscher, Daniel Ebeling, Udo D. Schwarz: Q-controlled Dynamic Force Microscopy in Air and Liquids
- Hideki Kawakatsu: High-Frequency Dynamic Force Microscopy
- Chanmin Su, Lin Huang, Craig B. Prater, Bharat Bhushan: Torsional ResonanceMicroscopy and Its Applications
- Yaxin Song, Bharat Bhushan: Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy
- Justyna Wiedemair, Boris Mizaikoff, Christine Kranz: Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale
- Pietro Giuseppe Gucciardi, Sebastiano Trusso, Cirino Vasi, Salvatore Patanè, Maria Allegrini: Near-Field Raman Spectroscopy and Imaging
- 2006, XLV, 344 Seiten, Masse: 15,9 x 24,3 cm, Gebunden, Englisch
- Herausgegeben: Bharat Bhushan, Harald Fuchs, Satoshi Kawata
- Verlag: Springer, Berlin
- ISBN-10: 3540373152
- ISBN-13: 9783540373155
- Erscheinungsdatum: 18.10.2006
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